Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry

Area of Science:

• Optics and X-ray Science
• Materials Science
• Metrology

Background:

• Refractive X-ray lenses are crucial components in synchrotron experiments.
• Various materials and fabrication methods exist, each with unique advantages and limitations.
• Quantitative analysis of lens performance is essential for optimizing experimental outcomes.

Purpose of the Study:

• To introduce a grating interferometer for the quantitative analysis of single refractive X-ray lenses.
• To compare the fabrication outcomes of a beryllium point focus lens and a polymer line focus lens.
• To assess material homogeneity and shape accuracy of different refractive X-ray lens types.

Main Methods:

• Development and application of a grating interferometer for phase retrieval.
• Quantitative analysis of local lens defects using phase gradient residuals.
• Decomposition of wavefront phase profiles into Zernike or Legendre polynomials to quantify shape aberrations.

Main Results:

• The grating interferometer provides quantitative data on refractive X-ray lens performance.
• Polymer lenses demonstrate superior material homogeneity compared to beryllium lenses.
• Beryllium lenses exhibit higher shape accuracy than polymer lenses.

Conclusions:

• The developed grating interferometer is effective for characterizing refractive X-ray lenses.
• Fabrication methods significantly impact lens properties, with trade-offs between homogeneity and shape accuracy.
• This study highlights the importance of quantitative metrology in selecting appropriate X-ray lenses for specific synchrotron applications.