Electrochemical Systems
Doppler Effect - II
Doppler Effect - I
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Updated: Mar 21, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Phase Doppler Anemometry (PDA) measurements of charged particles require specific layout configurations. This study identifies effective regions for PDA parameters, enabling accurate particle size and surface conductivity determination.
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