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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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Downsampling01:20

Downsampling

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When considering a sampled sequence with zero values between sampling instants, one can replace it by taking every N-th value of the sequence. At these integer multiples of N, the original and sampled sequences coincide. This process, known as decimation, involves extracting every N-th sample from a sequence, thereby creating a more efficient sequence.
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Related Experiment Video

Updated: Mar 21, 2026

ARL Spectral Fitting as an Application to Augment Spectral Data via Franck-Condon Lineshape Analysis and Color Analysis
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High-accuracy spectral reduction algorithm for the échelle spectrometer.

Lu Yin, Bayanheshig, Jin Yang

    Applied Optics
    |May 4, 2016
    PubMed
    Summary
    This summary is machine-generated.

    A new spectral reduction algorithm precisely maps wavelengths to pixel positions in échelle spectrometers. This method enhances spectral resolution and accuracy to meet engineering standards.

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    Area of Science:

    • Spectroscopy
    • Optical Engineering

    Background:

    • Échelle spectrometers with spherical mirrors present challenges in achieving precise wavelength-pixel mapping.
    • Spectral line bending and ray offsets can reduce accuracy in spectral analysis.

    Purpose of the Study:

    • To develop a spectral reduction algorithm for échelle spectrometers that establishes a one-to-one correspondence between wavelength and pixel position.
    • To improve the accuracy of spectral reduction by compensating for optical aberrations and prism effects.

    Main Methods:

    • A novel algorithm was developed to calculate the principal ray's offset and compensate for spectral line bending.
    • Simulations and experimental tests were conducted to validate the algorithm's performance.

    Main Results:

    • The algorithm successfully creates a one-to-one mapping between wavelength and pixel position.
    • Maximum deviation across the image plane was found to be less than one pixel.
    • High spectral resolution and precision meeting engineering standards were achieved.

    Conclusions:

    • The proposed spectral reduction algorithm significantly enhances the accuracy and resolution of échelle spectrometers.
    • This advancement provides a reliable method for precise spectral analysis in practical engineering applications.