An in situ correlative STEM-EDS and HRTEM based nanoscale chemical characterization of solid-liquid interfaces in an
S Eswara1, C Mitterbauer2, T Wirtz3
1Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, Belvaux, Luxembourg. santhana.eswara@list.lu.
Abstract:
The chemistry and the structure of solid-liquid interface in an Al-Si based alloy during high temperature phase transformation were characterized at nanoscale using scanning Transmission Electron Microscopy-EDS and HRTEM. Such studies were until recently limited by large sample drift associated with conventional heating holders. This study was made possible thanks to the modern low-drift MEMS-chip based localized heating technology. The results reveal that (i) the structural interface between solid (111) oriented Si phase and the liquid phase (i.e. decay of crystalline order) coexisting at 600°C is 3.2 nm wide (ii) the STEM-EDS chemical maps show inhomogeneous distribution of the elements with the solid phase being rich in Si and the liquid phase rich in Al (iii) the HRTEM and the HAADF images display respectively dark and bright intensity bands along the interface which could be due to apparent enrichment of Cu at the interface region resulting in enhanced amplitude-contrast (darker band in HRTEM) and Z-contrast (bright band in HAADF) and (iv) intriguingly, the concentration profiles within (i.e. compositional width) and across the solid-liquid interface display element-specific complex and asymmetric variation in the chemical widths.
