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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Angularly-selective transmission imaging in a scanning electron microscope.

Jason Holm1, Robert R Keller1

  • 1National Institute of Standards and Technology, Applied Chemicals and Materials Division, 325 Broadway, Boulder, CO 80305, United States.

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|May 15, 2016
PubMed
Summary
This summary is machine-generated.

Recent transmission scanning electron microscopy (t-SEM) advances introduce new angular selectivity for forward-scattered electrons. These innovations enable diverse imaging modes, enhancing contrast analysis for materials science applications.

Keywords:
ApertureCamera lengthHAADFHigh-angle annular dark-fieldSEMSTEM-in-SEMScanning electron microscopyTransmission detectorTransmission scanning electron microscopyt-SEM

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Area of Science:

  • Materials Science
  • Electron Microscopy

Background:

  • Transmission scanning electron microscopy (t-SEM) offers powerful imaging capabilities.
  • Advanced control over electron detection is crucial for extracting detailed material information.

Purpose of the Study:

  • To present recent advancements in t-SEM imaging control.
  • To enable comprehensive angular selectivity of forward-scattered electrons.

Main Methods:

  • Development of a modular aperture system.
  • Integration of a cantilever-style sample holder for angular selectivity.
  • Utilizing a solid-state transmission detector with enhanced capabilities.

Main Results:

  • Demonstration of numerous transmission imaging modes beyond basic bright-field and dark-field.
  • Successful acquisition of contrast arising from diffraction and mass-thickness variations.
  • Observation and analysis of unanticipated image contrast under specific conditions.

Conclusions:

  • The described advances significantly expand the utility of t-SEM for materials characterization.
  • The new system provides enhanced control for detailed analysis of electron scattering phenomena.
  • Further research is warranted to fully understand and exploit the observed contrast mechanisms.