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Updated: Mar 21, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
Gregory L Fisher1, Anne L Bruinen2, Nina Ogrinc Potočnik2
1Physical Electronics, Inc., Chanhassen, Minnesota 55317, United States.
A new Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) parallel imaging MS/MS spectrometer allows unambiguous molecular identification. This method simultaneously screens complex sample chemistry and targets matrix components for nanometer-scale surface analysis.
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