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Far-field optical nanothermometry using individual sub-50 nm upconverting nanoparticles
Jacob D Kilbane1, Emory M Chan2, Christian Monachon3
1Department of Mechanical Engineering, University of California, Berkeley, California 94720, USA. cdames@berkeley.edu.
Nanoscale
|May 25, 2016
Summary
We developed optical thermometry for individual nanoscale particles using rare-earth-doped nanoparticles. This method accurately measures temperature at the nanoscale, showing uniformity across particles.
Area of Science:
- Nanotechnology
- Optical Physics
- Materials Science
Background:
- Accurate temperature measurement at the nanoscale is crucial for understanding and controlling processes in various fields.
- Conventional thermometry methods struggle with the spatial resolution required for individual nanoparticles.
- Rare-earth-doped nanoparticles offer unique optical properties suitable for sensing applications.
Purpose of the Study:
- To demonstrate far-field optical thermometry for individual, sub-50 nm nanoparticles.
- To characterize the temperature-dependent luminescence response of these nanoparticles.
- To assess the applicability of standard thermometry models and particle-to-particle uniformity.
Main Methods:
- Utilized far-field optical imaging to identify individual sodium yttrium fluoride (NaYF4) nanoparticles doped with erbium (Er3+) and ytterbium (Yb3+).
- Confirmed particle identification and dimensions using scanning electron microscopy (SEM).
- Characterized the luminescence thermometry response of single nanoparticles over a temperature range of 300 K to 400 K.
Main Results:
- Successfully identified and characterized individual NaYF4 nanoparticles as small as 20 × 20 × 40 nm(3).
- Demonstrated that a standard Arrhenius model accurately describes the thermometry response for these sub-50 nm particles.
- Observed good particle-to-particle uniformity, with response coefficients showing standard deviations below 5%.
Conclusions:
- Far-field optical thermometry is effective for individual nanoscale particles.
- The technique achieves spatial resolution on the order of 50 nm, surpassing the diffraction limit.
- This method holds significant potential for fundamental thermal measurements and nanoscale metrology in industrial applications.

