You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Mar 20, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Luis Botaya1, Xavier Coromina2, Josep Samitier3
1Department of Electronics, Universitat de Barcelona, Barcelona 08028, Spain. lbotaya@el.ub.edu.
This study introduces a novel multiprobe electrical measurement system using quartz tuning forks (QTFs) and metallic tips for precise 3D positioning. The system enables accurate impedance measurements of samples with advanced spatial control.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: