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Study of local atomic order in amorphous materials in a computerized transmission electron microscope
G Balossier1, R K Garg, P Bonhomme
1Laboratoire de Microscopie Electronique, U.F.R. Sciences, INSERM U 314, Reims, France.
Journal of Electron Microscopy Technique
|March 1, 1989
Abstract:
Experimental results obtained by electron diffraction (ED) and extended electron energy loss fine structure (EXELFS) techniques to study the local atomic order in amorphous materials such as carbon, silicon, and its oxides are described. Potential applications of ED and EXELFS techniques and their limitations are also discussed.