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Related Experiment Videos

Electronic core level microanalyses and microcopies in multipurpose apparatus.

J Cazaux1, D Gramari, O Jbara

  • 1Laboratoire de Spectroscopie des Electrons, Faculté des Sciences, Reims, France.

Journal of Electron Microscopy Technique
|March 1, 1989
PubMed
Summary

This study introduces advanced microanalysis techniques using electron and X-ray excitations for detailed material characterization. The developed methods enable high-resolution imaging and elemental analysis, expanding the scope of surface science investigations.

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Area of Science:

  • Materials Science and Surface Analysis
  • Microscopy and Spectroscopy

Background:

  • Conventional microanalytical techniques have limitations in resolving fine surface details and elemental composition.
  • The need for versatile instruments capable of multiple spectroscopic and imaging modes is crucial for comprehensive material characterization.

Purpose of the Study:

  • To develop and demonstrate a suite of microanalytical techniques based on inner-shell electron excitations.
  • To showcase the capabilities of a novel instrument equipped for electron and X-ray-based spectroscopies and imaging.
  • To illustrate the performance and limitations of each developed technique.

Main Methods:

  • Utilized an instrument with dual electron guns, an electron analyzer, and a Si(Li) detector.
  • Employed incident electrons and X-rays for inner-shell excitations.

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  • Applied techniques including EELS, EPMA, XAPS, e-AES, XPS, XAS, XAES, XRF, and SXR.

    • Main Results:

    • Successfully developed and applied multiple microanalytical techniques.
    • Obtained characteristic images using scanning modes, including X-ray microradiography and X-ray photoelectron microscopy.
    • Demonstrated the principle of the apparatus with specific examples for each spectroscopy and microscopy.

    Conclusions:

    • The developed microanalytical techniques offer a powerful platform for detailed material surface analysis.
    • The instrument's versatility allows for a wide range of applications in materials science and related fields.
    • Further research can explore the optimization and expansion of these techniques for advanced characterization.