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R D Geckeler1, N A Artemiev2, S K Barber2
1Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany.
Precise alignment of apertures in deflectometric profilometers is key for accurate optical surface metrology. This study details alignment procedures and analyzes aperture positioning effects on angle measurements for advanced beamline applications.
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