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Published on: May 13, 2020
Electrode-induced digital-to-analog resistive switching in TaO x -based RRAM devices
Xinyi Li1, Huaqiang Wu, Bin Gao
1Institute of Microelectronics, Tsinghua University, Beijing 100084, People's Republic of China.
Abstract:
In RRAM devices, electrodes play a significant role during the switching process. In this paper, different top electrodes are used for TaO y /Ta2O5-x /AlO σ triple-oxide-layer devices. Top electrode-induced digital resistive switching to analog resistive switching was observed. For Pt top electrode (TE) devices, abrupt digital resistive switching behavior was observed, while Al TE devices showed gradual analog resistive switching behavior. Devices with various AlO σ thicknesses and sizes were fabricated and characterized to evaluate the reliability of the analog resistive switching. The physical mechanisms responsible for this electrode-induced resistive switching behavior were discussed.
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