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Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy
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Fluorescence suppression using micro-scale spatially offset Raman spectroscopy.

Claudia Conti1, Alessandra Botteon, Chiara Colombo

  • 1Consiglio Nazionale delle Ricerche, Istituto per la Conservazione e la Valorizzazione dei Beni Culturali (ICVBC), Via Cozzi 53, 20125, Milano, Italy. conti@icvbc.cnr.it pavel.matousek@stfc.ac.uk.

The Analyst
|June 25, 2016
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Summary
This summary is machine-generated.

This study introduces micro-spatially offset Raman spectroscopy to suppress fluorescence in layered materials. The technique effectively retrieves sublayer Raman signals, overcoming limitations of conventional Raman microscopy.

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Area of Science:

  • Analytical Chemistry
  • Spectroscopy
  • Materials Science

Background:

  • Fluorescence interference often overwhelms Raman signals in turbid, layered materials.
  • Conventional Raman microscopy struggles to analyze sublayers beneath intensely fluorescing overlayers.
  • Developing methods for fluorescence suppression is crucial for analyzing complex samples.

Purpose of the Study:

  • To present a novel fluorescence suppression technique for Raman microscopy.
  • To enable the retrieval of Raman signals from sublayers in turbid matrices.
  • To demonstrate the effectiveness of micro-spatially offset Raman spectroscopy for this purpose.

Main Methods:

  • Utilizing micro-spatially offset Raman spectroscopy (µ-SORS).
  • Applying Monte Carlo simulations for theoretical performance analysis.
  • Conceptually demonstrating the technique on layered samples (paints, polymers, stones).

Main Results:

  • Achieved significant fluorescence background suppression, enabling sublayer signal retrieval.
  • Demonstrated fluorescence suppression factors ranging from 12 to over 430.
  • Obtained good quality Raman spectra even with intense fluorescence interference.

Conclusions:

  • Micro-spatially offset Raman spectroscopy offers a powerful solution for fluorescence suppression in Raman microscopy.
  • The technique significantly enhances the analysis of layered, turbid materials.
  • Broad applicability across various scientific and industrial fields is anticipated.