Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration...

Area of Science:

• Materials Science
• Nanotechnology
• Thermal Analysis

Background:

• Accurate quantification of probe-sample thermal interactions is crucial for Scanning Thermal Microscopy (SThM).
• Existing methods lack precision in characterizing thermal behavior in ambient conditions.
• A reliable temperature reference is needed for calibrating SThM measurements.

Purpose of the Study:

• To develop and validate a novel temperature calibration device for SThM.
• To quantify thermal interactions between the SThM probe and sample in air.
• To establish a precise temperature reference for SThM applications.

Main Methods:

• Design, fabrication, and characterization of a novel microfabricated temperature calibration device.
• Utilized SThM in passive mode to map the temperature distribution of the device.
• Applied a heat transfer model to interpret SThM data and determine thermal parameters.

Main Results:

• The novel device provides an accurate and spatially variable temperature distribution for calibration.
• Determined thermal contact resistance between the SThM tip and device to be 8.33 × 10^5 K/W.
• Confirmed that the probe-sample contact radius equals the probe's tip radius of curvature.

Conclusions:

• The developed temperature calibration device enables accurate quantification of SThM thermal interactions.
• The study provides a validated method for determining key thermal contact parameters.
• Established a foundation for a lumped-system steady-state model for SThM probes and their applications.