Measuring the diffraction properties of an imaging quartz(211) crystal.

Area of Science:

• X-ray optics
• Crystallography
• Plasma physics

Background:

• High-resolution X-ray spectroscopy is crucial for plasma diagnostics.
• Spherically bent crystals are used as dispersion elements in spectrometers.
• Accurate measurement of crystal rocking curve width is essential for determining spectrometer resolution.

Purpose of the Study:

• To measure the reflectivity curve of a spherically bent quartz(211) crystal using a dual goniometer X-ray system.
• To develop and test an analysis of the instrument response function for rocking curve width measurement.
• To determine the upper bound of the rocking curve width for the quartz crystal and its impact on spectrometer resolution.

Main Methods:

• Utilized a dual goniometer X-ray system for reflectivity measurements.
• Employed the Ti Kα1 characteristic spectral line at 4510.8 eV.
• Developed an analytical method to assess the instrument response function's effect on rocking curve width.

Main Results:

• The rocking curve width of the quartz(211) crystal was measured.
• An upper bound for the rocking curve width was determined to be 58 μrad.
• This resulted in a lower bound for the instrument resolving power of E/ΔE = 34,000.

Conclusions:

• The study successfully measured the rocking curve width of the Qz(211) crystal.
• Improved insight into the dual goniometer's operation and limitations was achieved.
• The findings provide critical data for optimizing high-resolution X-ray spectrometers for plasma studies.