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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Preparation of Samples for Electron Microscopy

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Related Experiment Video

Updated: Mar 18, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Low-noise humidity controller for imaging water mediated processes in atomic force microscopy.

I Gaponenko¹, L Gamperle¹, K Herberg¹

¹DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland.

The Review of Scientific Instruments

|July 3, 2016

Summary

This summary is machine-generated.

We developed a new humidity controller for atomic force microscopy (AFM) that precisely manages sample humidity and temperature. This low-noise system uses ultrasonic atomization for stable, water-saturated gas generation, improving nanoscale measurements.

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Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Area of Science:

Nanotechnology
Materials Science
Physical Chemistry

Background:

Precise control of environmental conditions is crucial for nanoscale measurements using atomic force microscopy (AFM).
Existing humidity control systems often lack stability or introduce noise, limiting experimental accuracy.
Variable-temperature fluid cells in AFM require robust humidity management for diverse applications.

Purpose of the Study:

To design and implement a novel low-noise continuous flow humidity controller for AFM.
To integrate this controller with a commercial variable-temperature AFM fluid cell.
To enable precise, independent control of humidity and temperature at the sample surface.

Main Methods:

A wet and dry gas mixing system utilizing an ultrasonic atomiser for water-saturated gas generation.
Integration with a commercial variable-temperature AFM fluid cell.
Inflow and outflow water content monitoring for condensation and icing detection.

Main Results:

Demonstration of a stable, low-noise continuous flow humidity controller.
Successful integration enabling precise humidity and temperature control during AFM measurements.
Characterization of ice layer formation on highly oriented pyrolytic graphite under controlled humidity.

Conclusions:

The developed humidity controller offers enhanced mechanical stability and low noise for AFM applications.
Independent control of humidity and temperature is achievable, allowing for detailed studies of environmental effects on nanoscale phenomena.
The system facilitates advanced research in materials science and nanotechnology requiring precise environmental control.