[Polarization Modeling and Analysis of Light Scattering Properties of Multilayer Films on Slightly Rough Substrate]

Area of Science:

• Optics and Photonics
• Materials Science
• Surface Science

Context:

• The demand for advanced polarization detection methods for multilayer films is increasing.
• Understanding light scattering polarization properties is crucial for material characterization and applications like stealth technology.

Purpose:

• To establish a polarized bidirectional reflectance distribution function (BRDF) model for multilayer films on slightly rough substrates.
• To investigate the light scattering polarization properties of monolayer anti-reflection and multilayer high-reflection films.

Summary:

• The study utilizes first-order vector perturbation theory and the polarization transfer matrix to develop a polarized BRDF model.
• For monolayer anti-reflection films, observation position significantly influences the degree of polarization, allowing distinction from bare substrates.
• For multilayer high-reflection films, the degree of polarization depends on layer number, optical thickness, incident light wavelength, and scattering angles.

Impact:

• The developed model provides a theoretical framework for the polarization detection of multilayer films.
• This research contributes to advancements in reflection stealth technology by enabling better characterization of film surfaces.
• Validation with experimental data confirms the model's correctness and rationality.