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Updated: Mar 18, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Lens coupled tunable Young's double pinhole system for hard X-ray spatial coherence characterization
This study introduces a compact X-ray interferometer for precise spatial coherence measurements. The tunable double-pinhole setup with refractive lenses offers high sensitivity and accuracy for characterizing X-ray sources.
Area of Science:
- Optics and Photonics
- X-ray Physics
- Metrology
Background:
- Spatial coherence is crucial for advanced X-ray imaging and microscopy.
- Traditional methods for characterizing X-ray spatial coherence can be complex and bulky.
Purpose of the Study:
- To develop and validate a compact, high-sensitivity method for hard X-ray spatial coherence characterization.
- To enable accurate measurement of source size and coherence properties.
Main Methods:
- Implementation of a modified Young's double-slit experiment with tunable pinhole separation.
- Utilizing a compound refractive lens as a Fourier transformer for compact far-field registration.
- Experimental testing at the ESRF ID06 beamline (8-25 keV).
Main Results:
- Demonstrated high sensitivity in determining spatial coherence by varying aperture separation.
- Achieved accurate measurements of spatial coherence and source size.
- Experimental results show excellent agreement with other established techniques.
Conclusions:
- The proposed tunable double-aperture interferometer is a compact and effective tool for hard X-ray coherence characterization.
- This method is suitable for comprehensive analysis of coherence properties in low emittance synchrotron sources.
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