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Integrated chip-scale Si3N4 wavemeter with narrow free spectral range and high stability.

Chao Xiang, Minh A Tran, Tin Komljenovic

    Optics Letters
    |July 16, 2016
    PubMed
    Summary

    We developed a compact, integrated chip-scale wavemeter using a Mach-Zehnder interferometer on a silicon nitride platform. This device offers enhanced stability and robustness compared to traditional fiber-based solutions.

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    Area of Science:

    • Photonics and Optical Engineering
    • Integrated Optics
    • Interferometry

    Background:

    • Fiber-based wavemeters are susceptible to environmental fluctuations.
    • Integrated photonic devices offer miniaturization and improved stability.
    • Accurate wavelength measurement is crucial in various optical applications.

    Purpose of the Study:

    • To design and fabricate a robust, chip-scale wavemeter.
    • To leverage silicon nitride photonics for low-loss optical delay.
    • To integrate phase information capabilities for advanced functionality.

    Main Methods:

    • Design and fabrication of an unbalanced Mach-Zehnder interferometer.
    • Utilizing a silicon nitride (Si3N4) photonic platform for low loss.
    • Integration of an optical hybrid for phase measurement.

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    Main Results:

    • Successful characterization of the integrated chip-scale wavemeter.
    • Achieved a free spectral range of 300 MHz.
    • Demonstrated enhanced stability and robustness against environmental variations.

    Conclusions:

    • The integrated wavemeter provides a compact and stable solution for wavelength measurement.
    • Silicon nitride platform enables efficient on-chip optical delay.
    • The device presents a significant advancement over conventional fiber-based wavemeters.