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Integrated chip-scale Si3N4 wavemeter with narrow free spectral range and high stability
Optics Letters
|July 16, 2016
Summary
We developed a compact, integrated chip-scale wavemeter using a Mach-Zehnder interferometer on a silicon nitride platform. This device offers enhanced stability and robustness compared to traditional fiber-based solutions.
Area of Science:
- Photonics and Optical Engineering
- Integrated Optics
- Interferometry
Background:
- Fiber-based wavemeters are susceptible to environmental fluctuations.
- Integrated photonic devices offer miniaturization and improved stability.
- Accurate wavelength measurement is crucial in various optical applications.
Purpose of the Study:
- To design and fabricate a robust, chip-scale wavemeter.
- To leverage silicon nitride photonics for low-loss optical delay.
- To integrate phase information capabilities for advanced functionality.
Main Methods:
- Design and fabrication of an unbalanced Mach-Zehnder interferometer.
- Utilizing a silicon nitride (Si3N4) photonic platform for low loss.
- Integration of an optical hybrid for phase measurement.
Main Results:
- Successful characterization of the integrated chip-scale wavemeter.
- Achieved a free spectral range of 300 MHz.
- Demonstrated enhanced stability and robustness against environmental variations.
Conclusions:
- The integrated wavemeter provides a compact and stable solution for wavelength measurement.
- Silicon nitride platform enables efficient on-chip optical delay.
- The device presents a significant advancement over conventional fiber-based wavemeters.
