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Updated: Mar 17, 2026
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Evaluation of the Effect of Attenuation Correction by External CT in a Semiconductor SPECT
Taku Uchibe1, Masahiro Miyai, Nobuhiro Yata
1Department of Radiology, Shimane University Hospital.
Abstract:
The discovery of NM530c with a cadmium-zinc-telluride detector (CdZnTe-SPECT) is superior to the conventional Anger-type SPECT with a sodium-iodide detector (NaI-SPECT) in terms of sensitivity and spatial resolution. However, in the clinical example, even in CdZnTe-SPECT, a count decrease in myocardium due to the attenuation of the gamma ray is an issue. This study was conducted to evaluate the effect of computed tomography attenuation correction (CTAC) in CdZnTe-SPECT with the help of external CT. We evaluated the revision effect of uniformity, influence by the difference in attenuation distance, contrast ratio, an uptake rate using the heart phantom. As a result of the phantom studies, a good revision effect was obtained. In the clinical study, there was a statistical significant difference between the contrast ratio before and after CTAC in the inferior wall. In addition, the contrast ratio before and after CTAC in CdZnTe-SPECT image was equal to those of NaI-SPECT image. It was suggested that CTAC using external CT in CdZnTe-SPECT was clinically useful for inferior wall.
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