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Preparation of Samples for Electron Microscopy

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

Fixation and Sectioning

Fixation and Sectioning

Two basic types of preparation are used to visualize specimens with a light microscope: wet mounts and fixed specimens.
The simplest type of preparation is the wet mount, in which the specimen is placed in a drop of liquid on the slide. A liquid specimen can be directly deposited on the slide using a dropper. Solid specimens, such as skin scraping, can be placed on the slide before adding a drop of liquid to prepare the wet mount. Sometimes the liquid is simply water, but stains are often added...

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: Mar 17, 2026

A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy

A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy

Published on: January 17, 2018

Accurate Cross Sections for Microanalysis.

¹Department of Physics and Astronomy and Center for Solid State Science, Arizona State University, Tempe, AZ 85287.

Journal of Research of the National Institute of Standards and Technology

|July 23, 2016

Summary

This summary is machine-generated.

This study presents new calculations for electron-induced ionization cross sections in electron beam microanalysis. The plane wave Born approximation is found to be inaccurate for low overvoltages, impacting X-ray emission intensity calculations.

Keywords:

electron beam x-ray microanalysis electron ionization cross sections microanalysis x-ray microanalysis

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Area of Science:

Materials Science
Atomic Physics
Analytical Chemistry

Background:

Electron beam microanalysis relies on accurate X-ray emission intensity calculations.
Existing theoretical and experimental data for ionization cross sections are limited, primarily to K-shells.

Purpose of the Study:

To present systematic calculations of K, L, and M shell ionization cross sections using the plane wave Born approximation.
To evaluate the applicability of this theoretical model across the electron energy range relevant to microanalysis.

Main Methods:

Employed systematic plane wave Born approximation calculations with exchange.
Calculated ionization cross sections for K, L, and M shells.
Compared theoretical results with experimental measurements for selected K-shells.

Main Results:

Presented comprehensive ionization cross section data for K, L, and M shells.
Demonstrated that the plane wave theory is inadequate for overvoltages below 2.5 V.
Highlighted limitations of current theoretical models in electron beam microanalysis.

Conclusions:

The plane wave Born approximation requires careful consideration of the overvoltage ratio.
Accurate ionization cross sections are crucial for precise quantitative analysis in electron microscopy.
Further development of theoretical models is needed for improved microanalysis accuracy.