Double moiré structured illumination microscopy with high-index materials
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Updated: Mar 17, 2026

A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
Abstract:
Structured illumination microscopy utilizes illumination of periodic light patterns to allow reconstruction of high spatial frequencies, conventionally doubling the microscope's resolving power. This Letter presents a structured illumination microscopy scheme with the ability to achieve 60 nm resolution by using total internal reflection of a double moiré pattern in high-index materials. We propose a realization that provides dynamic control over relative amplitudes and phases of four coherently interfering beams in gallium phosphide and numerically demonstrate its capability.
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