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A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
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A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors

Published on: May 30, 2016

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Double moiré structured illumination microscopy with high-index materials.

Yochai Blau, Doron Shterman, Guy Bartal

    Optics Letters
    |July 30, 2016
    PubMed
    Summary

    Structured illumination microscopy achieves 60 nm resolution using total internal reflection and a double moiré pattern. This advanced technique enhances microscope resolving power in high-index materials.

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