An improved matrix separation method for characterization of ultrapure germanium (8N)
M A Reddy1, R Shekhar1, Sunil Jai Kumar1
1National Centre for Compositional Characterization of Materials (NCCCM) Bhabha Atomic Research Centre, Hyderabad 500062, India.
Talanta
|July 31, 2016
Summary
This study presents an optimized matrix separation method for characterizing ultrapure germanium (8N purity). The technique effectively removes the germanium matrix, enabling precise impurity analysis for advanced material applications.
Area of Science:
- Analytical Chemistry
- Materials Science
- Inorganic Chemistry
Background:
- Ultrapure germanium is crucial for advanced semiconductor and detector applications.
- Accurate characterization of trace impurities in high-purity germanium is essential for performance.
- Existing methods may lack the sensitivity or specificity for 8N purity germanium.
Purpose of the Study:
- To develop and optimize a matrix separation method for characterizing 8N purity germanium.
- To achieve quantitative removal of the germanium matrix from trace impurities.
- To establish a sensitive and accurate analytical procedure for impurity determination.
Main Methods:
- Optimization of reaction temperature for in-situ chlorine gas reaction with germanium.
- Quantitative recovery studies for over 60 elements at the optimized temperature (230±5°C).
- Impurity determination using Inductively Coupled Plasma Quadrupole Mass Spectrometry (ICP-QMS) and High-Resolution Continuum Source Graphite Furnace Atomic Absorption Spectrometry (HR-CS-GFAAS).
Main Results:
- Quantitative removal of the germanium matrix achieved at 230±5°C.
- High recoveries (>90%) for most analytes, with exceptions noted for As, Se, Sn, Hg, Tl.
- Method demonstrated suitability for up to 10g Ge samples, yielding low parts per billion/trillion process blanks.
- Achieved low limits of detection (LOD) between 1.8-0.003 ng/g for impurities.
Conclusions:
- The developed matrix separation method is effective for characterizing 8N purity germanium.
- The method provides high accuracy and precision for trace impurity analysis.
- Successfully applied to the characterization of ultrapure germanium materials.
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