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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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Related Experiment Video

Updated: Mar 17, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
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Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1.

Daniel S Wastl1,2

  • 1Department of Nanobiotechnology, Institute for Biophysics, University of Natural Resources and Life Science, Muthgasse 11, Vienna, 1190, Austria.

Microscopy Research and Technique
|July 31, 2016
PubMed
Summary

Atomic force microscopy (AFM) now achieves true atomic resolution in ambient air. This breakthrough overcomes challenges posed by environmental contaminants and thin liquid films, enabling high-quality nanoscale imaging.

Keywords:
airambient conditionsatomic force microscopeatomic resolutionhydration layer

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Area of Science:

  • Nanotechnology
  • Surface Science
  • Microscopy

Background:

  • Atomic force microscopy (AFM) traditionally requires controlled environments like ultrahigh vacuum (UHV) for atomic resolution.
  • Uncontrolled environments, such as ambient air, present challenges due to pollutants and thin liquid films, hindering high-resolution imaging.
  • Previous limitations restricted detailed nanoscale analysis in realistic atmospheric conditions.

Approach:

  • This review focuses on the concept and application of ambient AFM for achieving atomic resolution.
  • It details the phenomenology of imaging in ambient conditions, analyzing associated problems.
  • Methods for scan parameter optimization and recently developed techniques for atomic resolution in air and ultra-thin liquid films are presented.

Key Points:

  • True atomic resolution has been achieved on both hydrophilic and hydrophobic samples in ambient air.
  • Understanding and mitigating the effects of environmental factors like water layers and contaminants is crucial.
  • Optimized scan parameters and novel techniques are key to overcoming ambient imaging challenges.

Conclusions:

  • Ambient AFM now enables true atomic resolution, expanding the capabilities of nanoscale imaging.
  • This advancement allows for fundamental process studies like friction and tribology in uncontrolled environments.
  • The reviewed techniques pave the way for high-resolution AFM analysis under realistic, everyday conditions.