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Updated: Mar 17, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Contributed Review: Quartz force sensing probes for micro-applications
Jean-Ochin Abrahamians1, Laurent Pham Van2, Stéphane Régnier1
1Sorbonne Universités, UPMC University Paris 06, UMR 7222, ISIR, F-75005 Paris, France.
Abstract:
As self-sensing and self-exciting probes, quartz sensors present many advantages over silicon cantilevers for microscopy, micro-robotics, and other micro-applications. Their development and use is further bolstered by the fact that they can be manufactured from common quartz components. This paper therefore reviews applications of the increasingly popular quartz tuning fork probes as force sensors in the literature and examines the options for higher-frequency quartz probes using the other available types of flexional, thickness-shear or length-extensional resonators.

