Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A practical guide for microdevice fabrication using a focused ion beam equipped with a flip-stage.

The Review of scientific instruments·2026
Same author

Structural Insight into ESI+-Generated Ions of Oxazolochlorin Derivatives Using Cryogenic Infrared Ion Spectroscopy.

Journal of the American Society for Mass Spectrometry·2025
Same author

Minisci Substitution with C-C Bond Formation in Reactions of Trityl Radicals with a Ruthenium-Bound Pyridyl-Imidazole Ligand.

Inorganic chemistry·2025
Same author

Giant quantum oscillations in thermal transport in low-density metals via electron absorption of phonons.

Proceedings of the National Academy of Sciences of the United States of America·2025
Same author

Scanning Thermal Microscopy Method for Self-Heating in Nonlinear Devices and Application to Filamentary Resistive Random-Access Memory.

ACS nano·2025
Same author

Unconventional magnetoresistance and resistivity scaling in amorphous CoSi thin films.

Scientific reports·2024

Related Experiment Video

Updated: Mar 17, 2026

Thermal Measurement Techniques in Analytical Microfluidic Devices
08:29

Thermal Measurement Techniques in Analytical Microfluidic Devices

Published on: June 3, 2015

10.2K

Nanoscale thermometry by scanning thermal microscopy.

Fabian Menges1, Heike Riel1, Andreas Stemmer2

  • 1IBM Research - Zurich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.

The Review of Scientific Instruments
|August 1, 2016
PubMed
Summary
This summary is machine-generated.

Researchers developed a new scanning thermal microscope for precise nanoscale temperature measurements. This advanced technique minimizes artifacts, enabling accurate analysis of thermal phenomena in microelectronic devices.

More Related Videos

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

8.2K
Studying the Effects of Temperature on the Nucleation and Growth of Nanoparticles by Liquid-Cell Transmission Electron Microscopy
07:02

Studying the Effects of Temperature on the Nucleation and Growth of Nanoparticles by Liquid-Cell Transmission Electron Microscopy

Published on: February 17, 2021

4.7K

Related Experiment Videos

Last Updated: Mar 17, 2026

Thermal Measurement Techniques in Analytical Microfluidic Devices
08:29

Thermal Measurement Techniques in Analytical Microfluidic Devices

Published on: June 3, 2015

10.2K
High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

8.2K
Studying the Effects of Temperature on the Nucleation and Growth of Nanoparticles by Liquid-Cell Transmission Electron Microscopy
07:02

Studying the Effects of Temperature on the Nucleation and Growth of Nanoparticles by Liquid-Cell Transmission Electron Microscopy

Published on: February 17, 2021

4.7K

Area of Science:

  • Nanoscience and nanotechnology
  • Scanning probe microscopy
  • Thermal analysis

Background:

  • Accurate temperature measurement at the nanoscale is a significant challenge.
  • Existing scanning thermal microscopy methods suffer from contact-related artifacts, limiting reliability.
  • Non-equilibrium thermometry offers a potential solution for enhanced accuracy.

Purpose of the Study:

  • To develop a high-vacuum scanning thermal microscope with nanoscopic spatial resolution.
  • To introduce a novel method for non-equilibrium scanning probe thermometry.
  • To minimize contact-related artifacts in nanoscale temperature measurements.

Main Methods:

  • Construction of an electromagnetically shielded, temperature-stabilized high-vacuum scanning thermal microscope.
  • Implementation of a dual signal-sensing technique for inferring temperature.
  • Probing total steady-state heat flux and temporally modulated heat flux simultaneously.

Main Results:

  • Achieved nanoscopic spatial resolution with sub-nanoWatt heat flux sensitivity.
  • Minimized contact-related artifacts, improving measurement reliability.
  • Successfully characterized microscope performance and demonstrated the thermometry approach on metal interconnects.

Conclusions:

  • The developed high-vacuum scanning thermal microscope and non-equilibrium thermometry method significantly advance nanoscale temperature measurement.
  • The technique effectively minimizes artifacts, leading to more reliable thermal analysis.
  • Demonstrated utility in studying localized heating phenomena, such as hot spots in microelectronic components.