Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A Review of the EUSO-Balloon Pathfinder for the JEM-EUSO Program.

Space science reviews·2022
Same author

First record of Cynoscion regalis (Pisces, Sciaenidae) in Portuguese continental waters.

Journal of fish biology·2017
Same author

Governance, organization, accountability and sustainability of a region-wide school-based deworming program in Loreto, Peru.

Acta tropica·2016
Same author

High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating.

The Review of scientific instruments·2015
Same author

Metabolic syndrome and obesity among users of second generation antipsychotics: A global challenge for modern psychopharmacology.

Pharmacological research·2015
Same author

Effectiveness of egg yolk immunoglobulin against the intracellular salmonid pathogen Piscirickettsia salmonis.

Journal of applied microbiology·2015

Related Experiment Video

Updated: Mar 17, 2026

Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
10:36

Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials

Published on: January 21, 2016

11.4K

High temperature Hall measurement setup for thin film characterization.

L Adnane1, A Gokirmak1, H Silva1

  • 1Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA.

The Review of Scientific Instruments
|August 1, 2016
PubMed
Summary

This study presents an automated Hall measurement system for semiconducting thin films up to 500°C. The setup accurately determines carrier mobility and concentration using the van der Pauw method and improved I-V analysis.

More Related Videos

Thermal Measurement Techniques in Analytical Microfluidic Devices
08:29

Thermal Measurement Techniques in Analytical Microfluidic Devices

Published on: June 3, 2015

10.2K
High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

8.2K

Related Experiment Videos

Last Updated: Mar 17, 2026

Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
10:36

Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials

Published on: January 21, 2016

11.4K
Thermal Measurement Techniques in Analytical Microfluidic Devices
08:29

Thermal Measurement Techniques in Analytical Microfluidic Devices

Published on: June 3, 2015

10.2K
High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

8.2K

Area of Science:

  • Materials Science
  • Solid State Physics
  • Electrical Engineering

Background:

  • Hall measurements are crucial for characterizing semiconductor properties like carrier mobility and concentration.
  • The van der Pauw technique offers a contact-pattern-free method for Hall measurements.
  • Existing methods may have limitations in temperature range or automation.

Purpose of the Study:

  • To develop an automated Hall measurement system for semiconducting thin films.
  • To extend the measurement capability to high temperatures (up to ~500°C).
  • To improve the accuracy of Hall coefficient and resistivity determination.

Main Methods:

  • Utilized the van der Pauw method for Hall measurements.
  • Developed an automated setup with a semiconductor parameter analyzer.
  • Employed multiple current-voltage (I-V) measurements under varying magnetic fields (up, zero, down).
  • Used slopes from multiple I-Vs for enhanced accuracy.

Main Results:

  • Successfully measured Hall coefficient and resistivity of semiconducting thin films.
  • Achieved accurate measurements across a wide resistivity range.
  • Demonstrated reliability and accuracy using single-crystal silicon samples.
  • The automated system operates from room temperature to ~500°C.

Conclusions:

  • The developed automated Hall measurement system is accurate and reliable for characterizing semiconducting thin films.
  • The high-temperature capability and improved accuracy make it suitable for advanced materials research.
  • The van der Pauw technique, enhanced by automated I-V analysis, provides a robust characterization tool.