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Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable

Min Lu, Shengjia Wang, Laura Aulbach

    Applied Optics
    |August 10, 2016
    PubMed
    Summary

    Adjustable aperture multiplexing (AAM) enables simultaneous measurement of out-of-plane displacement and its derivative using electronic speckle pattern interferometry. This method simplifies systems for enhanced stability and flexibility in dynamic measurements.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Interferometry

    Background:

    • Electronic speckle pattern interferometry (ESPI) is a widely used technique for non-contact surface measurement.
    • Simultaneous measurement of displacement and its derivatives offers more comprehensive surface analysis.
    • Existing ESPI systems can be complex and lack flexibility for diverse applications.

    Purpose of the Study:

    • To introduce and validate the Adjustable Aperture Multiplexing (AAM) technique for ESPI.
    • To enable simultaneous measurement of out-of-plane displacement and its first-order derivative.
    • To enhance the stability, flexibility, and adaptability of ESPI systems.

    Main Methods:

    • Implementation of AAM by creating virtual double apertures with variable parameters in a three-beam ESPI setup.
    • Generation of multiple tunable spatial carrier frequencies within the speckle pattern.
    • Phase retrieval using inverse Fourier transform on selected frequency-domain spectra.

    Main Results:

    • Successful separation of three interferograms in the frequency domain.
    • Simultaneous acquisition of phase maps for deformation and surface slope.
    • Demonstration of dynamic and simultaneous measurement capabilities.

    Conclusions:

    • AAM significantly simplifies the ESPI system architecture.
    • The technique improves system stability and adaptability to various measurement needs.
    • AAM provides a robust method for simultaneous displacement and slope measurement.