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Enhanced Piezoelectric Response due to Polarization Rotation in Cobalt-Substituted BiFeO3 Epitaxial Thin Films
Keisuke Shimizu1, Hajime Hojo2, Yuichi Ikuhara3
1Materials and Structures Laboratory, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8503, Japan.
Abstract:
Polarization rotation induced by an external electric field in piezoelectric materials such as PbZr1-x Tix O3 is generally regarded as the origin of their large piezoelectric responses. Here, the piezoelectric responses of high-quality cobalt-substituted BiFeO3 epitaxial thin films with monoclinic distortions are systematically examined. It is demonstrated that polarization rotation plays a crucial role in improving the piezoelectric responses in this material.
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