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Numerical studies of focal modulation microscopy in high-NA system
Optics Express
|August 25, 2016
Abstract:
High spatial resolution with deep imaging penetration depth is the main advantage of focal modulation microscopy (FMM). This paper investigates effects of polarization on FMM in a high-NA system based on vectorial diffraction theory. Compared with confocal microscopy, FMM shows a 20.1% improvement in axial resolution. The performance of different polarization patterns is also discussed numerically. The study on polarization modulation may provide a new way to obtain a tighter focal spot.
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