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Updated: Mar 15, 2026

Sample Preparation and Transfer Protocol for In-Vacuum Long-Wavelength Crystallography on Beamline I23 at Diamond Light Source

Sample Preparation and Transfer Protocol for In-Vacuum Long-Wavelength Crystallography on Beamline I23 at Diamond Light Source

Published on: April 23, 2021

Diamond beamline I07: a beamline for surface and interface diffraction.

Chris Nicklin¹, Tom Arnold¹, Jonathan Rawle¹

¹Beamline I07, Diamond Light Source Ltd, UK.

Journal of Synchrotron Radiation

|September 1, 2016

Summary

This summary is machine-generated.

Beamline I07 at Diamond Light Source offers advanced surface and interface structure analysis. New capabilities enable studying liquid surfaces and in situ ultrahigh-vacuum environments for materials science research.

Keywords:

X-ray diffraction X-ray scattering grazing incidence interfaces reflectivity structure surface surface structure

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Area of Science:

Materials Science
Surface Science
Condensed Matter Physics

Background:

Beamline I07 is optimized for surface and interface structure studies.
It accommodates diverse sample types, from soft matter to ultrahigh vacuum (UHV).

Purpose of the Study:

To detail the capabilities and advancements of Beamline I07.
To highlight its application in studying surface and interface structures across various environments.

Main Methods:

Utilizes a 2+3 diffractometer for grazing-incidence techniques (surface X-ray diffraction, X-ray reflectivity, GISAXS/WAXS).
Incorporates a double-crystal deflector for studying liquid surfaces and interfaces.
Features a second endstation with a diffractometer and environmental chamber for in situ UHV studies, including scanning tunnelling microscopy, low-energy electron diffraction, and X-ray photoelectron spectroscopy.

Main Results:

Demonstrates the versatility of grazing-incidence techniques for structural analysis.
Enables the study of novel sample environments, including liquid surfaces and UHV conditions.
Facilitates correlative studies using multiple surface science techniques on the same sample.

Conclusions:

Beamline I07 provides a comprehensive platform for advanced surface and interface characterization.
The integrated techniques and environmental capabilities significantly expand the scope of structural studies.
The beamline supports detailed analysis of material growth and nanoscale phenomena.