Hazard Rate
Signal Flow Graphs
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Wei He1, Yueke Wang1, Kefei Xing1
1School of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha, Hu Nan Province, China.
This study introduces a new method to assess space instrument vulnerability to soft errors using a multi-signal flow graph model. The research quantifies the system functional error rate (SFER) and meantime to failure (MTTF) for FPGA platforms.
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