A simple photoionization scheme for characterizing electron and ion spectrometers
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Updated: Mar 15, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
A Wituschek1, J von Vangerow1, J Grzesiak1
1Physikalisches Institut, Universität Freiburg, 79104 Freiburg, Germany.
Abstract:
We present a simple diode laser-based photoionization scheme for generating electrons and ions with well-defined spatial and energetic (≲2 eV) structures. This scheme can easily be implemented in ion or electron imaging spectrometers for the purpose of off-line characterization and calibration. The low laser power ∼1 mW needed from a passively stabilized diode laser and the low flux of potassium atoms in an effusive beam make our scheme a versatile source of ions and electrons for applications in research and education.
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