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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Mar 15, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Robust atomic force microscopy using multiple sensors.

Mayank Baranwal¹, Ram S Gorugantu¹, Srinivasa M Salapaka¹

¹Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.

The Review of Scientific Instruments

|September 3, 2016

Summary

This summary is machine-generated.

This study introduces a new atomic force microscopy control design using an extra piezo motion sensor. This dual-sensor approach significantly enhances imaging speed and stability for better sample analysis.

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Last Updated: Mar 15, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

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Published on: June 13, 2023

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Area of Science:

Surface science
Nanotechnology
Control engineering

Background:

Atomic force microscopy (AFM) typically uses cantilever deflection for imaging and property estimation.
Amplitude-modulation AFM (AM-AFM) and contact-mode AFM rely on regulating cantilever deflection for topography.
Existing methods face limitations in bandwidth and robustness due to complex dynamics.

Purpose of the Study:

To propose and evaluate an augmented control design for AFM using an additional vertical z-piezo motion sensor.
To improve imaging bandwidth and robustness in AFM, particularly in AM-AFM.
To leverage piezo motion sensor data for enhanced control not available from deflection signals alone.

Main Methods:

Developed a control design scheme augmenting deflection-based control with a vertical z-piezo motion sensor feedback.
Employed H∞ control framework for designing the piezo-sensor based feedback.
Evaluated the augmented design in both AM-AFM and contact-mode AFM experiments.

Main Results:

The two-sensor design in AM-AFM substantially improved robustness to modeling uncertainties, eliminating sensitivity peaks without reducing bandwidth.
Contact-mode AFM imaging showed over 30% improvement in bandwidth and over 20% in robustness to modeling uncertainties.
The augmented design demonstrated significant enhancements in imaging bandwidth and overall system robustness.

Conclusions:

Augmenting AFM control with a z-piezo motion sensor offers significant improvements in imaging performance.
The proposed method enhances robustness and bandwidth, overcoming limitations of traditional deflection-based control.
This dual-sensor approach provides a more reliable and efficient method for AFM imaging and analysis.