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Updated: Mar 15, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope
Meng Li1, Chunkai Xu1, Panke Zhang1
1Hefei National Laboratory for Physical Science at Microscale and Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
We developed a new scanning probe electron energy spectrometer (SPEES) for in situ surface analysis. This technique achieves high-resolution spectroscopy mapping, surpassing the incident electron beam size.
Area of Science:
- Surface science
- Spectroscopy
- Microscopy
Background:
- In situ surface analysis requires high spatial resolution.
- Existing techniques face limitations in combining topography and spectroscopy.
Purpose of the Study:
- To introduce a novel scanning probe electron energy spectrometer (SPEES).
- To demonstrate its capability for in situ topography imaging and electron energy spectroscopy mapping.
- To evaluate the spatial resolution of the SPEES technique.
Main Methods:
- Combining a double toroidal analyzer with a scanning tunneling microscope.
- Performing in situ surface analysis.
- Measuring spatial resolution of spectroscopy mapping and electron beam spot size.
Main Results:
- Achieved spatial resolution for spectroscopy mapping better than 0.7 ± 0.2 μm.
- Measured field emission electron beam spot size of approximately 3.6 ± 0.8 μm.
- Demonstrated spatial resolution of SPEES is superior to the incident electron beam size.
Conclusions:
- The novel SPEES technique offers high-resolution in situ surface analysis.
- SPEES provides combined topography and spectroscopy mapping capabilities.
- The technique's spatial resolution exceeds conventional limitations.
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