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    We derived new equations for partially coherent Mueller matrix reflection polarimetry on inhomogeneous samples. These equations provide a general framework and a specific solution for layered media.

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    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Mueller matrix polarimetry is a powerful technique for characterizing materials.
    • Analyzing spatially inhomogeneous samples presents significant challenges.
    • Understanding light-sample interactions requires robust theoretical frameworks.

    Purpose of the Study:

    • To derive fundamental equations for partially coherent Mueller matrix reflection polarimetry.
    • To provide a general theoretical framework applicable to inhomogeneous samples.
    • To develop a specific solution for the important case of two juxtaposed media.

    Main Methods:

    • First-principles derivation of polarimetric equations.
    • Application of Mueller calculus to reflection scenarios.
    • Analysis of partially coherent light interaction with surfaces.

    Main Results:

    • General expressions governing partially coherent Mueller matrix reflection polarimetry were derived.
    • Specific expressions for two juxtaposed media were obtained.
    • The developed framework accounts for spatial inhomogeneity in samples.

    Conclusions:

    • The derived equations offer a comprehensive theoretical basis for analyzing inhomogeneous samples using polarimetry.
    • This work advances the understanding of light interaction with complex material interfaces.
    • The findings are crucial for applications requiring precise optical characterization of heterogeneous materials.