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Custom sample environments at the ALBA XPEEM.

Michael Foerster1, Jordi Prat1, Valenti Massana1

  • 1ALBA Synchrotron Light Facility, Carrer de la Llum 2-26, Cerdanyola del Vallés, 08290 Barcelona, Spain.

Ultramicroscopy
|September 14, 2016
PubMed
Summary
This summary is machine-generated.

Custom sample holders at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) enable advanced, non-standard measurements. These holders support diverse experiments, including time-resolved studies with synchronized electronics.

Keywords:
(X)PEEMElectric contactsIn-situ electromagnetQuadrupoleSample environmentUHV suitcase

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Area of Science:

  • Materials Science
  • Surface Science
  • Spectroscopy

Background:

  • The ALBA synchrotron's PhotoEmission Electron Microscope (PEEM) facilitates advanced surface analysis.
  • Non-standard sample manipulation is crucial for exploring novel material properties.

Purpose of the Study:

  • To present custom-built sample holders for the ALBA synchrotron PEEM.
  • To highlight the expanded measurement capabilities offered by these holders.

Main Methods:

  • Development of custom sample holders with ultrahigh vacuum (UHV) compatibility.
  • Integration of built-in electromagnets for versatile magnetic field application (in-plane and out-of-plane).
  • Incorporation of electronics for synchronized sample excitation and time-resolved measurements.

Main Results:

  • The sample holders enable a wide range of non-standard measurements.
  • Compatibility with offline deposition and characterization systems is achieved.
  • Combined magnetic, electric field, and current injection experiments are supported.
  • Time-resolved measurements are feasible due to synchronized sinusoidal signal electronics.

Conclusions:

  • The custom sample holders significantly enhance the experimental capabilities of the ALBA synchrotron PEEM.
  • These holders facilitate advanced research in surface science and materials characterization.
  • The system supports complex experiments, including time-resolved and multi-field applications.