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Vicente Durán, Peter A Andrekson, Víctor Torres-Company

    Optics Letters
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    This summary is machine-generated.

    Electro-optic dual-comb interferometry now spans the telecommunications C band, overcoming previous bandwidth limitations. This advancement enables high-speed broadband metrology for applications like optical coherence tomography.

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    Area of Science:

    • Quantum optics and spectroscopy
    • Metrology and measurement science

    Background:

    • Dual-comb interferometry (DCI) is a powerful technique for high-resolution spectral analysis.
    • Electro-optic frequency combs offer advantages in DCI, including mutual coherence and high speed.
    • Limited optical bandwidth has been a key challenge for electro-optic DCI systems.

    Purpose of the Study:

    • To overcome the limited optical bandwidth of electro-optic frequency combs in dual-comb interferometry.
    • To demonstrate broadband electro-optic DCI covering the telecommunications C band.

    Main Methods:

    • Utilized coherent spectral broadening to enhance the optical bandwidth of electro-optic frequency combs.
    • Implemented dual-comb interferometry using spectrally broadened electro-optic combs.
    • Acquired spectral data over the C band with high signal-to-noise ratio per spectral line.

    Main Results:

    • Demonstrated electro-optic DCI across the entire telecommunications C band (approximately 40 nm bandwidth).
    • Successfully retrieved 200 spectral lines with a signal-to-noise ratio of 100 per line.
    • Achieved rapid spectral acquisition within 10 microseconds.

    Conclusions:

    • Coherent spectral broadening effectively expands the bandwidth of electro-optic DCI.
    • This work establishes electro-optic DCI as a viable technology for high-speed, broadband metrology.
    • Potential applications include optical coherence tomography and coherent Raman microscopy.