Patch Testing for Evaluation of Hypersensitivity to Implanted Metal Devices: A Perspective From the American Contact

Peter C Schalock1, Glen Crawford, Susan Nedorost

  • 1From the *Department of Dermatology, Massachusetts General Hospital, Harvard School of Medicine, Boston; †Department of Dermatology, University of Pennsylvania, Philadelphia; ‡University Hospitals Case Medical Center, Cleveland, OH; §Department of Dermatology, Brigham and Women's Hospital, Harvard School of Medicine, Boston, MA; ∥Duke Dermatology, Duke University Medical Center, Durham, NC; ¶Department of Dermatology, Geisinger Health System, Danville, PA; #Department of Dermatology, George Washington University, Washington, DC; **Yale University School of Medicine, New Haven, CT; ††Division of Dermatology, McGill University Health Centre, Montréal, Quebec, Canada; ‡‡Division of Dermatology, UMass Memorial Medical Center, Worcester; §§University of Illinois at Chicago; ∥∥Division of Dermatology, Departments of Medicine and Medical Microbiology and Immunology, University of Alberta, Edmonton, Canada; ¶¶Department of Dermatology, Stanford University, Palo Alto, CA; ##Department of Dermatology, University of Utah, Salt Lake City; ***Dermatology-Plastic Surgery Institute, Cleveland Clinic, OH; and †††Department of Medicine (Dermatology), University of Toronto, Ontario, Canada.