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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Unipolar resistive switching and tunneling oscillations in isolated Si-SiO x core-shell nanostructure
Ujjwal Ghanta1, Mallar Ray, Nil Ratan Bandyopadhyay
1School of Materials Science and Engineering, Indian Institute of Engineering Science and Technology, Shibpur, Howrah-711103, India.
Abstract:
Unipolar resistive switching (URS) is observed in isolated Si-SiO x core-shell nanostructures. I-V characteristics recorded by a conductive atomic force microscope tip show SET and RESET processes with self compliance behavior. Hopping of carriers through defect states in the high resistance state (HRS) and space charge limited conduction in the low resistance state (LRS) are found to be the dominant carrier transport mechanisms in Si-SiO x core-shell nanostructures. URS between LRS and HRS may be attributed to the transition between hydrogen bridge (Si-H-Si) and hydrogen doublet (Si-HH-Si) defects. During RESET process, charge carriers tunnel through the nanostructure giving rise to oscillatory conduction.
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