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Updated: Mar 14, 2026

Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
Published on: December 3, 2013
F Bencivenga1, A Calvi2, F Capotondi1
1Elettra-Sincrotrone Trieste S.C.p.A., S.S. 14 km 163.5 in AREA Science Park, 34149 Basovizza, Italy. filippo.bencivenga@elettra.eu.
We demonstrated X-ray transient gratings (X-TG) using a seeded free electron laser (FEL) to study silicon nitride dynamics. This method reveals ultrafast electron relaxation and slower thermal diffusion, offering enhanced sensitivity for FEL-induced electron dynamics.
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