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Jian Xiong1, Shulin Tian2, Chenglin Yang2
1School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China; Department of Communication Engineering, Chengdu Technological University, Chengdu 611731, China.
This study introduces a new failure sample selection method that accounts for failure propagation. By considering subsequent failure propagation sets, it enhances test coverage and reduces usage risks compared to traditional methods.
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