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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The number of nuclear spins aligned in the lower energy state is slightly greater than those in the higher energy state. In the presence of an external magnetic field, as the spins precess at the Larmor frequency, the excess population results in a net magnetization oriented along the z axis. When a pulse or a short burst of radio waves at the Larmor frequency is applied along the x axis, the coupling of frequencies causes resonance and flips the nuclear spins of the excess population from the...
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Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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High-sensitivity imaging with lateral resonance mode atomic force microscopy.

Ren-Feng Ding1, Chih-Wen Yang2, Kuang-Yuh Huang3

  • 1Institute of Physics, Academia Sinica, 11529, Taipei, Taiwan. yangcw@phys.sinica.edu.tw ishwang@phys.sinica.edu.tw and Department of Mechanical Engineering, National Taiwan University, 10617, Taipei, Taiwan.

Nanoscale
|November 4, 2016
PubMed
Summary
This summary is machine-generated.

Large tips on atomic force microscope cantilevers enable detection of lateral resonance (LR) modes. This new method offers high-speed, high-sensitivity imaging and characterization of in-plane mechanical properties.

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Area of Science:

  • Surface science
  • Nanotechnology
  • Materials science

Background:

  • Dynamic mode atomic force microscopy (AFM) typically uses cantilever oscillation near resonance frequency.
  • Lateral bending resonances (LR) are generally not utilized due to detection challenges with standard beam-deflection methods.

Purpose of the Study:

  • To investigate the potential of utilizing lateral resonance (LR) in atomic force microscopy.
  • To demonstrate that LR can be detected using the beam-deflection method, particularly with modified cantilevers.

Main Methods:

  • Utilized micro-fabricated cantilevers, specifically those with large tips.
  • Employed finite-element analysis to understand the physics of out-of-plane displacement in LR.
  • Performed sample imaging using LR, torsional resonance, and tapping modes for comparison.

Main Results:

  • Discovered that cantilevers with large tips exhibit detectable out-of-plane displacement during LR.
  • Finite-element analysis confirmed the large tip as the primary cause of out-of-plane coupling in LR.
  • LR mode imaging showed reduced deformation and noise in height maps, and high contrast with low noise in phase maps.
  • LR mode operates at significantly higher resonance frequencies compared to tapping mode.

Conclusions:

  • Lateral resonance (LR) mode, enabled by large-tipped cantilevers, is a viable and detectable atomic force microscopy technique.
  • LR mode offers advantages including high-speed scanning, enhanced sensitivity, and the ability to map in-plane mechanical properties.
  • This technique presents a powerful new approach for detailed material characterization using atomic force microscopy.