Jove
Visualize
Contact Us

Related Experiment Videos

Practical phase identification by convergent beam electron diffraction.

J Mansfield1

  • 1North Campus Electron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor 48109-2143.

Journal of Electron Microscopy Technique
|September 1, 1989
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Address.

The Dental register·2021
Same author

Editorial: aminosalicylates in Crohn's disease-prevalence, risks, costs and time to re-assess?

Alimentary pharmacology & therapeutics·2018
Same author

A protein-truncating R179X variant in RNF186 confers protection against ulcerative colitis.

Nature communications·2016
Same author

Thiopurine withdrawal during sustained clinical remission in inflammatory bowel disease: relapse and recapture rates, with predictive factors in 237 patients.

Alimentary pharmacology & therapeutics·2014
Same author

Vulval oedema: how many doctors does it take to make a diagnosis?

European journal of obstetrics, gynecology, and reproductive biology·2013
Same author

Diets containing inulin but not lupins help to prevent swine dysentery in experimentally challenged pigs.

Journal of animal science·2010
Same journal

Detection and identification of viruses by electron microscopy.

Journal of electron microscopy technique·2020
Same journal

A Simple Method for Quick-Freezing.

Journal of electron microscopy technique·2015
Same journal

Shrinkage in tertiary butanol prior to freeze drying.

Journal of electron microscopy technique·1991
Same journal

An alkali digestion method to expose connective tissue fibers: a scanning electron microscopy study of rat lung.

Journal of electron microscopy technique·1991
Same journal

Cross-sectional transmission electron microscopy of X-ray multilayer thin film structures.

Journal of electron microscopy technique·1991
Same journal

Dry fracturing and cutting techniques for scanning electron microscopy of poly-vinyl chloride particles: application to internal structure observations.

Journal of electron microscopy technique·1991
See all related articles
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

This guide details phase identification using analytical electron microscopy and convergent beam electron diffraction. It offers practical steps for specimen preparation, reciprocal space exploration, and phase analysis via symmetry or fingerprinting.

Area of Science:

  • Materials Science
  • Crystallography
  • Analytical Chemistry

Background:

  • Accurate phase identification is crucial in materials science for understanding material properties and performance.
  • Analytical electron microscopy (AEM) offers high spatial resolution for microstructural analysis.
  • Convergent beam electron diffraction (CBED) is a powerful technique for crystallographic analysis in AEM.

Purpose of the Study:

  • To provide a practical, step-by-step guide for identifying crystalline phases using AEM with CBED.
  • To outline methods for specimen preparation and reciprocal space exploration for effective phase analysis.
  • To detail phase identification strategies, including symmetry analysis and pattern fingerprinting.

Main Methods:

  • Specimen preparation techniques suitable for CBED analysis.

Related Experiment Videos

  • Systematic exploration of reciprocal space within the analytical electron microscope.
  • Phase identification through crystallographic symmetry analysis of diffraction patterns.
  • Phase identification by comparing observed diffraction patterns with a database (fingerprinting).
  • Main Results:

    • A comprehensive methodology for phase identification in AEM using CBED.
    • Practical tips and shortcuts to streamline the phase analysis workflow.
    • Demonstration of both symmetry-based and fingerprinting approaches for accurate phase determination.

    Conclusions:

    • CBED in AEM provides a robust method for precise phase identification.
    • The presented guide enhances the practical application of CBED for materials characterization.
    • This approach facilitates routine and accurate phase analysis in diverse material systems.