Related Experiment Video
Updated: Sep 6, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Techniques of convergent beam electron diffraction
1Physics Department, Bristol University, England.
Abstract:
The techniques required to record standard convergent beam electron diffraction patterns in an analytical electron microscope are discussed in detail, with emphasis on the design of electron optics in commercial instruments. Practical comments are included on specimen preparation, the influence of crystal defects, tilting to major zone axes, and alignment of the instrument. The influence of parameters under experimental control such as probe size, accelerating voltage, temperature, specimen thickness, and convergence angle is discussed in detail. Some comments are included on the alignment and limitations of large angle patterns formed by a defocused probe.
More Related Videos
Related Concept Videos
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Overview of Electron Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Transmission Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Microscopy Techniques

