Dental x-ray spectrometry with an Si(Li) semiconductor

Spectra from a dental x-ray apparatus with varying tube potentials and various added filters were measured with the use of an Si(Li) semiconductor. The mean energies of the spectra were calculated to estimate radiation qualities under various conditions. A phantom lip made of Arcylite was used to compare the attenuated quantities of radiation incident on the lip, according to the radiation quality, resulting from various tube potentials and added filtration.