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Implementation of Interference Reflection Microscopy for Label-free, High-speed Imaging of Microtubules
Published on: August 8, 2019
Sebastian Cartier1, Matias Kagias1, Anna Bergamaschi1
1Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
The MÖNCH detector, with its small 25 µm pitch, achieves 1 µm resolution using interpolation algorithms for high-resolution X-ray imaging. This advancement benefits synchrotron applications by overcoming detector limitations.
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