Nanox: a miniature mechanical stress rig designed for near-field X-ray diffraction imaging techniques

Area of Science:

• Materials Science
• Crystallography
• Mechanical Engineering

Background:

• Multi-modal characterization using 3D X-ray diffraction and imaging offers advanced insights into polycrystalline materials.
• Synchrotron acquisition times now permit four-dimensional (time-lapse) studies, necessitating compatible in-situ mechanical testing devices.

Purpose of the Study:

• To present a novel, space-constrained tensile device for switching between X-ray (holo)tomography, diffraction contrast tomography, and topotomography during mechanical testing.
• To demonstrate the 3D characterization capabilities of this device on an Al-Li alloy multicrystal.

Main Methods:

• Development and implementation of a specialized tensile device for in-situ mechanical testing.
• Utilizing diffraction contrast tomography for initial 3D material characterization.
• Employing repeated topotomography during deformation to observe grain behavior.
• Monitoring diffraction spot peak broadening throughout the experiment.

Main Results:

• Successful 3D characterization of an Al-Li alloy multicrystal.
• Identification of slip bands and sudden lattice rotations within a selected grain using in-situ topography.
• Correlation of deformation levels with observed microstructural changes and lattice behavior.

Conclusions:

• The developed tensile device effectively enables multi-modal 3D X-ray characterization during mechanical loading.
• The study demonstrates the potential for in-situ observation of deformation mechanisms in polycrystalline materials.
• This approach advances the understanding of material behavior under stress at the microstructural level.